Two circle X-ray diffractometer (XRD)

A two circle x-ray diffractometer is a standard tool to investigate the crystallographic quality of epitaxial thin films. Using suitable collimation of the x-ray beam and precise positioning of the sample position one can use low angle x-ray diffraction tomdetermine the film thickness and interface roughness of thin films and multilayers. A Philips X'pert MPD diffractometer with a home made dedicated sample platform is available for this purpose.

X-ray goniometer with sample platform for reflectometry